In situ transport measurements on ultra thin polycrystalline Fe films show a
logarithmic temperature dependence of the anomalous Hall conductivity for
sheet resistances less than ~3 kilo-Ohm. I will argue that this is due to
universal weak localization correction within the skew scattering model.
For higher sheet resis tances, the prefactors of the ln(T) correction terms
in the longitudinal and Hall conductivities decrease at different rates with
increasing disorder. I will show that a granular model captures the qualitative features.